검색결과 : 16건
| No. | Article |
|---|---|
| 1 |
Silicon based MIS photoanode for water oxidation: A comparison of RuO2 and Ni Schottky contacts Mikolasek M, Frohlich K, Husekova K, Racko J, Rehacek V, Chymo F, Tapajna M, Harmatha L Applied Surface Science, 461, 48, 2018 |
| 2 |
X-ray diffraction analysis of residual stresses in textured ZnO thin films Dobrocka E, Novak P, Buc D, Harmatha L, Murin J Applied Surface Science, 395, 16, 2017 |
| 3 |
Simulation of real I-V characteristics of metal/GaN/AlGaN heterostructure based on the 12-EXT model of trap-assisted tunnelling Racko J, Benko P, Mikolasek M, Granzner R, Kittler M, Schwierz F, Harmatha L, Breza J Applied Surface Science, 395, 122, 2017 |
| 4 |
Analysis of low temperature output parameters for investigation of silicon heterojunction solar cells Mikolasek M, Racko J, Harmatha L Applied Surface Science, 395, 166, 2017 |
| 5 |
Defect distribution in InGaAsN/GaAs multilayer solar cells Kosa A, Stuchlikova L, Harmatha L, Mikolasek M, Kovac J, Sciana B, Dawidowski W, Radziewicz D, Tlaczala M Solar Energy, 132, 587, 2016 |
| 6 |
A model of trap-assisted tunneling in GaN/AlGaN/GaN heterostructure based on exchange times Racko J, Benko P, Hotovy I, Harmatha L, Mikolasek M, Granzner R, Kittler M, Schwierz F, Breza J Applied Surface Science, 312, 68, 2014 |
| 7 |
Capacitance properties and simulation of the AlGaN/GaN Schottky heterostructure Harmatha L, Stuchlikova L, Racko J, Marek J, Pechacek J, Benko P, Nemec M, Breza J Applied Surface Science, 312, 102, 2014 |
| 8 |
Capacitance study of carrier inversion at the amorphous/crystalline silicon heterojunction passivated by different thicknesses of i-layer Mikolasek M, Stuchlikova L, Harmatha L, Vincze A, Nemec M, Racko J, Breza J Applied Surface Science, 312, 152, 2014 |
| 9 |
Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness Mikolasek M, Nemec M, Vojs M, Jakabovic J, Rehacek V, Zhang D, Zeman M, Harmatha L Thin Solid Films, 558, 315, 2014 |
| 10 |
Electrical characterization of the A(III)B(V)-N heterostructures by capacitance methods Stuchlikova L, Harmatha L, Petrus M, Rybar J, Sebok J, Sciana B, Radziewicz D, Pucicki D, Tlaczala M, Kosa A, Benko P, Kovac J, Juhasz P Applied Surface Science, 269, 175, 2013 |