검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Depolarization correction method for ellipsometric measurements of large grain size zinc-oxide films Papa Z, Budai J, Hanyecz I, Csontos J, Toth Z Thin Solid Films, 571, 562, 2014 |
| 2 |
Ellipsometric analysis of silicon surfaces textured by ns and sub-ps KrF laser pulses Toth Z, Hanyecz I, Gardian A, Budai J, Csontos J, Papa Z, Fule M Thin Solid Films, 571, 631, 2014 |
| 3 |
Characterization of pulsed laser deposited hydrogenated amorphous silicon films by spectroscopic ellipsometry Hanyecz I, Budai J, Szilagyi E, Toth Z Thin Solid Films, 519(9), 2855, 2011 |
| 4 |
Ellipsometric study of SixC films: Analysis of Tauc-Lorentz and Gaussian oscillator models Budai J, Hanyecz I, Szilagyi E, Toth Z Thin Solid Films, 519(9), 2985, 2011 |
| 5 |
Ellipsometric study of nanostructured carbon films deposited by pulsed laser deposition Bereznai M, Budai J, Hanyecz I, Kopniczky J, Veres M, Koos M, Toth Z Thin Solid Films, 519(9), 2989, 2011 |