검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Pore pressure prediction while drilling: Three-dimensional earth model in the Gulf of Mexico Mosca F, Djordjevic O, Hantschel T, McCarthy J, Krueger A, Phelps D, Akintokunbo T, Joppen T, Koster K, Schupbach M, Hampshire K, MacGregor A AAPG Bulletin, 102(4), 691, 2018 |
| 2 |
Combined Petroleum System Modeling and Comprehensive Two-Dimensional Gas Chromatography To Improve Understanding of the Crude Oil Chemistry in the Llanos Basin, Colombia Bartha A, De Nicolais N, Sharma V, Roy SK, Srivastava R, Pomerantz AE, Sanclemente M, Perez W, Nelson RK, Reddy CM, Gros J, Arey JS, Lelijveld J, Dubey S, Tortella D, Hantschel T, Peters KE, Mullins OC Energy & Fuels, 29(8), 4755, 2015 |
| 3 |
Integrated charge and seal assessment in the Monagas fold and thrust belt of Venezuela Neumaier M, Littke R, Hantschel T, Maerten L, Joonnekindt JP, Kukla P AAPG Bulletin, 98(7), 1325, 2014 |
| 4 |
Two-dimensional carrier mapping at the nanometer-scale on 32 nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy Eyben P, Clarysse T, Mody J, Nazir A, Schulze A, Hantschel T, Vandervorst W Solid-State Electronics, 71, 69, 2012 |
| 5 |
Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon Eyben P, Clemente F, Vanstreels K, Pourtois G, Clarysse T, Duriau E, Hantschel T, Sankaran K, Mody J, Vandervorst W, Mylvaganam K, Zhang LC Journal of Vacuum Science & Technology B, 28(2), 401, 2010 |
| 6 |
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy De Wolf P, Stephenson R, Trenkler T, Clarysse T, Hantschel T, Vandevorst W Journal of Vacuum Science & Technology B, 18(1), 361, 2000 |
| 7 |
Evaluating probes for "electrical" atomic force microscopy Trenkler T, Hantschel T, Stephenson R, De Wolf P, Vandervorst W, Hellemans L, Malave A, Buchel D, Oesterschulze E, Kulisch W, Niedermann P, Sulzbach T, Ohlsson O Journal of Vacuum Science & Technology B, 18(1), 418, 2000 |
| 8 |
Practicalities and limitations of scanning capacitance microscopy for routine integrated circuit characterization Stephenson R, De Wolf P, Trenkler T, Hantschel T, Clarysse T, Jansen P, Vandervorst W Journal of Vacuum Science & Technology B, 18(1), 555, 2000 |
| 9 |
Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy. De Wolf P, Geva M, Reynolds CL, Hantschel T, Vandervorst W, Bylsma RB Journal of Vacuum Science & Technology A, 17(4), 1285, 1999 |