| 1 |
Thickness-dependent quantum oscillations of the transport properties in bismuth selenide thin films
Rogacheva EI, Menshikova SI, Sipatov AY, Nashchekina ON
Thin Solid Films, 684, 31, 2019 |
| 2 |
Use of XPS to clarify the Hall coefficient sign variation in thin niobium layers buried in silicon
Demchenko IN, Lisowski W, Syryanyy Y, Melikhov Y, Zaytseva I, Konstantynov P, Chernyshova M, Cieplak MZ
Applied Surface Science, 399, 32, 2017 |
| 3 |
A study on the electrical properties of Mn-Co-Ni-O thin films grown by radio frequency magnetron sputtering with different thicknesses
Kong WW, Wei W, Gao B, Chang AM
Applied Surface Science, 423, 1012, 2017 |
| 4 |
Room temperature transport measurements on Bridgman-grown p-type CuIn1-xGaxSe2
Champness CH, Cheung T, Shih I
Solar Energy Materials and Solar Cells, 91(9), 791, 2007 |
| 5 |
Films as characteristic consolidated nanostructured materials
Andrievski RA
Materials Science Forum, 518, 9, 2006 |
| 6 |
Impurity conduction observed in Al-doped 6H-SIC
Krieger M, Semmelroth K, Pensl G
Materials Science Forum, 457-460, 685, 2004 |
| 7 |
Majority carriers in pyrite thin films: an analysis based on Seebeck and Hall coefficient measurements
Ares JR, Ferrer IJ, Sanchez CR
Thin Solid Films, 431-432, 511, 2003 |
