검색결과 : 1건
No. | Article |
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1 |
Modeling of abnormal capacitance-voltage characteristics observed in MOS transistor with ultra-thin gate oxide Hsu YL, Fang YK, Tsao FC, Kuo FJ, Ho Y Solid-State Electronics, 46(11), 1941, 2002 |
No. | Article |
---|---|
1 |
Modeling of abnormal capacitance-voltage characteristics observed in MOS transistor with ultra-thin gate oxide Hsu YL, Fang YK, Tsao FC, Kuo FJ, Ho Y Solid-State Electronics, 46(11), 1941, 2002 |