화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Submicron contacts for electrical characterization of semiconducting WS2 thin films
Ballif C, Regula M, Levy F, Burmeister F, Schafle C, Matthes T, Leiderer P, Niedermann P, Gutmannsbauer W, Bucher R
Journal of Vacuum Science & Technology A, 16(3), 1239, 1998
2 A Nanoscopic View of Structure and Deformation of Hard Elastic Polypropylene with Scanning Force Microscopy
Hild S, Gutmannsbauer W, Luth R, Fuhrmann J, Guntherodt HJ
Journal of Polymer Science Part B: Polymer Physics, 34(12), 1953, 1996
3 Statics and Dynamics of Ferroelectric Domains Studied with Scanning Force Microscopy
Luthi R, Haefke H, Gutmannsbauer W, Meyer E, Howald L, Guntherodt HJ
Journal of Vacuum Science & Technology B, 12(4), 2451, 1994
4 Sled-Type Motion on the Nanometer-Scale - Determination of Dissipation and Cohesive Energies of C-60
Luthi R, Meyer E, Haefke H, Howald L, Gutmannsbauer W, Guntherodt HJ
Science, 266(5193), 1979, 1994