화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Unzipping and movement of Lomer-type edge dislocations in Ge/GeSi/Si(001) heterostructures
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 483, 265, 2018
2 Self-assembled strained GeSiSn nanoscale structures grown by MBE on Si(100)
Nikiforov AI, Timofeev VA, Tuktamyshev AR, Yakimov AI, Mashanov VI, Gutakovskii AK
Journal of Crystal Growth, 457, 215, 2017
3 Sn - Induced decomposition of SiGeSn alloys grown on Si by molecular-beam epitaxy
Talochkin AB, Timofeev VA, Gutakovskii AK, Mashanov VI
Journal of Crystal Growth, 478, 205, 2017
4 Unexpected travel of Lomer-type dislocations in Ge/GexSi1-x/Si(001) heterostructures
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Thin Solid Films, 616, 348, 2016
5 Edge misfit dislocations in the GeSi/Si(001) pair: Conditions and specific features of high-quantity generation
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 338(1), 12, 2012
6 Specific features of formation and propagation of 60 degrees and 90 degrees misfit dislocations in GexS1-x/Si films with x > 0.4
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 312(21), 3080, 2010
7 Formation of edge misfit dislocations in Ge chi Si1-chi (chi similar to 0.4-0.5) films grown on misoriented (001) -> (111) Si substrates
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 310(15), 3422, 2008
8 Pulsed ion-beam assisted deposition of Ge nanocrystals on SiO(2) for non-volatile memory device
Stepina NP, Dvurechenskii AV, Armbrister VA, Kirienko VV, Novikov PL, Kesler VG, Gutakovskii AK, Smagina ZV, Spesivtzev EV
Thin Solid Films, 517(1), 313, 2008
9 Dominating nucleation of misfit dislocations from the surface in GeSi/Si(001) films with a stepwise composition grown by means of molecular-beam epitaxy
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Revenko MA, Sokolov L
Journal of Crystal Growth, 293(2), 247, 2006
10 Sb as surfactant at plastic relaxation of GeSi/Si(001) films grown by molecular-beam epitaxy: Reduction of surface roughness value
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov L
Journal of Crystal Growth, 297(1), 57, 2006