화학공학소재연구정보센터
검색결과 : 29건
No. Article
1 Effect of high-k and vacuum dielectrics as gate stack on a junctionless cylindrical surrounding gate (JL-CSG) MOSFET
Sharma A, Jain A, Pratap Y, Gupta RS
Solid-State Electronics, 123, 26, 2016
2 A new T-Shaped Source/Drain Extension (T-SSDE) Gate Underlap GAA MOSFET with enhanced subthreshold analog/RF performance for low power applications
Kumar M, Haldar S, Gupta M, Gupta RS
Solid-State Electronics, 101, 13, 2014
3 Scattering parameter based modeling and simulation of symmetric tied-gate InAlAs/InGaAs DG-HEMT for millimeter-wave applications
Bhattacharya M, Jogi J, Gupta RS, Gupta M
Solid-State Electronics, 63(1), 149, 2011
4 Subcellular localization of adenosine kinase in mammalian cells: The long isoform of AdK is localized in the nucleus
Cui XA, Singh B, Park J, Gupta RS
Biochemical and Biophysical Research Communications, 388(1), 46, 2009
5 Novel mitochondrial extensions provide evidence for a link between microtubule-directed movement and mitochondrial fission
Bowes T, Gupta RS
Biochemical and Biophysical Research Communications, 376(1), 40, 2008
6 Temperature dependent analytical model of sub-micron GaN MESFETs for microwave frequency applications
Kabra S, Kaur H, Haldar S, Gupta M, Gupta RS
Solid-State Electronics, 52(1), 25, 2008
7 An analytical threshold voltage model for graded channel asymmetric gate stack (GCASYMGAS) surrounding gate MOSFET
Kaur H, Kabra S, Haldar S, Gupta RS
Solid-State Electronics, 52(2), 305, 2008
8 Gate dielectric engineering of quarter sub micron AlGaN/GaN MISHFET: A new device architecture for improved transconductance and high cut-off frequency
Aggarwal R, Agrawal A, Gupta M, Gupta RS
Solid-State Electronics, 52(10), 1610, 2008
9 Multi-material gate poly-crystalline thin film transistors: Modeling and simulation for an improved gate transport efficiency
Sehgal A, Mangla T, Gupta M, Gupta RS
Thin Solid Films, 516(8), 2162, 2008
10 Impact of graded channel (GC) design in fully depleted cylindrical/surrounding gate MOSFET (FD CGT/SGT) for improved short channel immunity and hot carrier reliability
Kaur H, Kabra S, Bindra S, Haldar S, Gupta RS
Solid-State Electronics, 51(3), 398, 2007