1 |
Effect of high-k and vacuum dielectrics as gate stack on a junctionless cylindrical surrounding gate (JL-CSG) MOSFET Sharma A, Jain A, Pratap Y, Gupta RS Solid-State Electronics, 123, 26, 2016 |
2 |
A new T-Shaped Source/Drain Extension (T-SSDE) Gate Underlap GAA MOSFET with enhanced subthreshold analog/RF performance for low power applications Kumar M, Haldar S, Gupta M, Gupta RS Solid-State Electronics, 101, 13, 2014 |
3 |
Scattering parameter based modeling and simulation of symmetric tied-gate InAlAs/InGaAs DG-HEMT for millimeter-wave applications Bhattacharya M, Jogi J, Gupta RS, Gupta M Solid-State Electronics, 63(1), 149, 2011 |
4 |
Subcellular localization of adenosine kinase in mammalian cells: The long isoform of AdK is localized in the nucleus Cui XA, Singh B, Park J, Gupta RS Biochemical and Biophysical Research Communications, 388(1), 46, 2009 |
5 |
Novel mitochondrial extensions provide evidence for a link between microtubule-directed movement and mitochondrial fission Bowes T, Gupta RS Biochemical and Biophysical Research Communications, 376(1), 40, 2008 |
6 |
Temperature dependent analytical model of sub-micron GaN MESFETs for microwave frequency applications Kabra S, Kaur H, Haldar S, Gupta M, Gupta RS Solid-State Electronics, 52(1), 25, 2008 |
7 |
An analytical threshold voltage model for graded channel asymmetric gate stack (GCASYMGAS) surrounding gate MOSFET Kaur H, Kabra S, Haldar S, Gupta RS Solid-State Electronics, 52(2), 305, 2008 |
8 |
Gate dielectric engineering of quarter sub micron AlGaN/GaN MISHFET: A new device architecture for improved transconductance and high cut-off frequency Aggarwal R, Agrawal A, Gupta M, Gupta RS Solid-State Electronics, 52(10), 1610, 2008 |
9 |
Multi-material gate poly-crystalline thin film transistors: Modeling and simulation for an improved gate transport efficiency Sehgal A, Mangla T, Gupta M, Gupta RS Thin Solid Films, 516(8), 2162, 2008 |
10 |
Impact of graded channel (GC) design in fully depleted cylindrical/surrounding gate MOSFET (FD CGT/SGT) for improved short channel immunity and hot carrier reliability Kaur H, Kabra S, Bindra S, Haldar S, Gupta RS Solid-State Electronics, 51(3), 398, 2007 |