검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Scanning Probe Microscopy on the Surface of Si(111) Meyer E, Howald L, Luthi R, Haefke H, Ruetschi M, Bonner T, Overney R, Frommer J, Hofer R, Guntheroidt HJ Journal of Vacuum Science & Technology B, 12(3), 2060, 1994 |
| No. | Article |
|---|---|
| 1 |
Scanning Probe Microscopy on the Surface of Si(111) Meyer E, Howald L, Luthi R, Haefke H, Ruetschi M, Bonner T, Overney R, Frommer J, Hofer R, Guntheroidt HJ Journal of Vacuum Science & Technology B, 12(3), 2060, 1994 |