검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements Ouled-Khachroum T, Richard MI, Noe P, Guichet C, Mocuta C, Sabbione C, Hippert F, Thomas O Thin Solid Films, 617, 44, 2016 |
| 2 |
Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements Richard MI, Fouet J, Guichet C, Mocuta C, Thomas O Thin Solid Films, 530, 100, 2013 |
| 3 |
Microstructural analysis of AU/NI multilayers interfaces by SAXS and STM Labat S, Guichet C, Thomas O, Gilles B, Marty A Applied Surface Science, 188(1-2), 182, 2002 |