검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique Berthet F, Petitdidier S, Guhel Y, Trolet JL, Mary P, Vivier A, Gaquiere C, Boudart B Solid-State Electronics, 127, 13, 2017 |
| 2 |
Impact of microwave annealing on CeO2 thin films sputtered on (111) Si Toloshniak T, Guhel Y, Bernard J, Besq A, Marinel S, Boudart B Materials Research Bulletin, 70, 712, 2015 |
| 3 |
Ceramic thick film humidity sensor based on MgTiO3 + LiF Kassas A, Bernard J, Lelievre C, Besq A, Guhel Y, Houivet D, Boudart B, Lakiss H, Hamieh T Materials Research Bulletin, 48(10), 3987, 2013 |
| 4 |
Characterization and analysis of electrical trap related effects on the reliability of AlGaN/GaN HEMTs Berthet F, Guhel Y, Gualous H, Boudart B, Trolet JL, Piccione M, Sbrugnera V, Grimbert B, Gaquiere C Solid-State Electronics, 72, 15, 2012 |
| 5 |
Growth and structural characterization of cerium oxide thin films realized on Si(111) substrates by on-axis r.f. magnetron sputtering Ta MT, Briand D, Guhel Y, Bernard J, Pesant JC, Boudart B Thin Solid Films, 517(1), 450, 2008 |
| 6 |
Impact of plasma pre-treatment before SiNx passivation on AlGaN/GaN HFETs electrical traps Guhel Y, Boudart B, Vellas N, Gaquiere C, Delos E, Ducatteau D, Bougrioua Z, Germain M Solid-State Electronics, 49(10), 1589, 2005 |