검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Precision measurement of the weak charge of the proton Androic D, Armstrong DS, Asaturyan A, Averett T, Balewski J, Bartlett K, Beaufait J, Beminiwattha RS, Benesch J, Benmokhtar F, Birchall J, Carlini RD, Cornejo JC, Dusa SC, Dalton MM, Davis CA, Deconinck W, Diefenbach J, Dowd JF, Dunne JA, Dutta D, Duvall WS, Elaasar M, Falk WR, Finn JM, Forest T, Gal C, Gaskell D, Gericke MTW, Grames J, Gray VM, Grimm K, Guo F, Hoskins JR, Jones D, Jones M, Jones R, Kargiantoulakis M, King PM, Korkmaz E, Kowalski S, Leacock J, Leckey J, Lee AR, Lee JH, Lee L, MacEwan S, Mack D, Magee JA, Mahurin R, Mammei J, Martin JW, McHugh MJ, Meekins D, Mei J, Mesick KE, Michaels R, Micherdzinska A, Mkrtchyan A, Mkrtchyan H, Morgan N, Narayan A, Ndukum LZ, Nelyubin V, Nuhait H, Nuruzzaman, van Oers WTH, Opper AK, Page SA, Pan J, Paschke KD, Phillips SK, Pitt ML, Poelker M, Rajotte JF, Ramsay WD, Roche J, Sawatzky B, Seva T, Shabestari MH, Silwal R, Simicevic N, Smith GR, Solvignon P, Spayde DT, Subedi A, Subedi R, Suleiman R, Tadevosyan V, Tobias WA, Tvaskis V, Waidyawansa B, Wang P, Wells SP, Wood SA, Yang S, Young RD, Zhamkochyan PZS, Zhamkochyan S Nature, 557(7704), 207, 2018 |
| 2 |
Measurement of parity violation in electron-quark scattering Wang D, Pan K, Subedi R, Deng X, Ahmed Z, Allada K, Aniol KA, Armstrong DS, Arrington J, Bellini V, Beminiwattha R, Benesch J, Benmokhtar F, Bertozzi W, Camsonne A, Canan M, Cates GD, Chen JP, Chudakov E, Cisbani E, Dalton MM, de Jager CW, De Leo R, Deconinck W, Deur A, Dutta C, El Fassi L, Erler J, Flay D, Franklin GB, Friend M, Frullani S, Garibaldi F, Gilad S, Giusa A, Glamazdin A, Golge S, Grimm K, Hafidi K, Hansen JO, Higinbotham DW, Holmes R, Holmstrom T, Holt RJ, Huang J, Hyde CE, Jen CM, Jones D, Kang H, King PM, Kowalski S, Kumar KS, Lee JH, LeRose JJ, Liyanage N, Long E, McNulty D, Margaziotis DJ, Meddi F, Meekins DG, Mercado L, Meziani ZE, Michaels R, Mihovilovic M, Muangma N, Myers KE, Nanda S, Narayan A, Nelyubin V, Nuruzzaman, Oh Y, Parno D, Paschke KD, Phillips SK, Qian X, Qiang Y, Quinn B, Rakhman A, Reimer PE, Rider K, Riordan S, Roche J, Rubin J, Russo G, Saenboonruang K, Saha A, Sawatzky B, Shahinyan A, Silwal R, Sirca S, Souder PA, Suleiman R, Sulkosky V, Sutera CM, Tobias WA, Urciuoli GM, Waidyawansa B, Wojtsekhowski B, Ye L, Zhao B, Zheng X Nature, 506(7486), 67, 2014 |
| 3 |
Defect related photoluminescence of SiGe/Si heterostructures grown by APCVD Shi JL, Nanver LK, Grimm K, Visser CCG Thin Solid Films, 364(1-2), 254, 2000 |
| 4 |
Facet investigation in selective epitaxial growth of Si and SiGe on (001) Si for optoelectronic devices Vescan L, Grimm K, Dieker C Journal of Vacuum Science & Technology B, 16(3), 1549, 1998 |