화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Electrical properties of aluminum oxide films grown by atomic layer deposition on n-type 4H-SiC
Avice M, Grossner U, Monakhov EV, Grillenberger J, Nilsen O, Fjellvag H, Svensson BG
Materials Science Forum, 483, 705, 2005
2 Investigation of electronic states of Pd in 4H-SiC by means of Radiotracer-DLTS
Grossner U, Grillenberger J, Albrecht F, Pasold G, Sielemann R, Svensson BG, Witthuhn W
Materials Science Forum, 457-460, 791, 2004
3 Radiotracer spectroscopy on group II acceptors in GaN
Albrecht F, Pasold G, Grillenberger J, Reislohner U, Dietrich M, Witthuhn W
Materials Science Forum, 457-460, 1609, 2004
4 Polytype dependence of transition metal-related deep levels in 4H-, 6H-and 15R-SiC
Grillenberger J, Achtziger N, Pasold G, Witthuhn W
Materials Science Forum, 389-3, 573, 2002
5 A deep erbium-related bandgap state in 4H silicon carbide
Pasold G, Albrecht F, Grillenberger J, Grossner U, Hulsen C, Sielemann R, Witthuhn W
Materials Science Forum, 433-4, 487, 2002
6 Band gap states of Cr in the lower part of the SiC band gap
Pasold G, Achtziger N, Grillenberger J, Witthuhn W
Materials Science Forum, 353-356, 471, 2001
7 Tantalum and tungsten in silicon carbide: Identification and polytype dependence of deep levels
Grillenberger J, Achtziger N, Pasold G, Sielemann R, Witthuhn W
Materials Science Forum, 353-356, 475, 2001
8 On the existence of deep levels of the accepters Ga and In and of the potential double accepters Zn and Cd in SiC
Achtziger N, Grillenberger J, Uhrmacher M, Witthuhn W
Materials Science Forum, 338-3, 749, 2000