검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Inelastic Mean Free Pathlengths of Electrons for Quantitative Investigations of Ultrathin Technological Surface-Layers by Angle-Resolved X-Ray Photoelectron Spectrometry Gries WH Journal of Vacuum Science & Technology A, 13(3), 1304, 1995 |
| 2 |
Angle-Resolved Self-Ratio Measurements on Ion-Implanted Depth Profiles by Synchrotron X-Ray-Fluorescence Spectrometry Schmitt W, Rothe J, Hormes J, Gries WH Journal of Vacuum Science & Technology A, 12(4), 2467, 1994 |