검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Low energy ion scattering (LEIS) of as-formed and chemically modified display glass and peak-fitting of the Al/Si LEIS peak envelope Cushman CV, Bruner P, Zakel J, Dahlquist C, Sturgell B, Grehl T, Lunt BM, Banerjee J, Smith NJ, Linford MR Applied Surface Science, 455, 18, 2018 |
| 2 |
Time-of-flight secondary ion mass spectrometry of wet and dry chemically treated display glass surfaces Cushman CV, Zakel J, Sturgell BS, Major GI, Lunt BM, Bruner P, Grehl T, Smith NJ, Linford MR Journal of the American Ceramic Society, 100(10), 4770, 2017 |
| 3 |
Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS Prusa S, Prochazka P, Babor P, Sikola T, ter Veen R, Fartmann M, Grehl T, Bruner P, Roth D, Bauer P, Brongersma HH Langmuir, 31(35), 9628, 2015 |
| 4 |
Depth profiling of organic materials using improved ion beam conditions Cramer HG, Grehl T, Kollmer F, Moellers R, Niehuis E, Rading D Applied Surface Science, 255(4), 966, 2008 |
| 5 |
Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitations Grehl T, Mollers R, Niehuis E, Rading D Applied Surface Science, 255(4), 1404, 2008 |
| 6 |
Mass spectrometric characterization of DNA microarrays as a function of primary ion species Hellweg S, Jacob A, Hoheisel JD, Grehl T, Arlinghaus HF Applied Surface Science, 252(19), 6742, 2006 |
| 7 |
Low energy dual beam depth profiling: influence of sputter and analysis beam parameters on profile performance using TOF-Sims Grehl T, Mollers R, Niehuis E Applied Surface Science, 203, 277, 2003 |