| 1 |
Non-conventional scans in high-resolution X-ray diffraction analysis of epitaxial systems
Dobrocka E, Hasenohrl S, Chauhan P, Kuzmik J
Applied Surface Science, 461, 23, 2018 |
| 2 |
High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure
Lazarev S, Bauer S, Forghani K, Barchuk M, Scholz F, Baumbach T
Journal of Crystal Growth, 370, 51, 2013 |
| 3 |
Composition and atomic ordering of Ge/Si(001) wetting layers
Malachias A, Metzger TH, Stoffel M, Schmidt OG, Holy V
Thin Solid Films, 515(14), 5587, 2007 |
| 4 |
Characterization of the interface strain/stress state in Si-on-sapphire heterostructure
Mogilyanski D, Gartstein E, Metzger H
Materials Science Forum, 347-3, 568, 2000 |
| 5 |
Depth-profiles of structure in single- and multilayered commercial polymer films using grazing-incidence X-ray diffraction
Murthy NS, Bednarczyk C, Minor H
Polymer, 41(1), 277, 2000 |
| 6 |
Grain-Size and Strain in Thin Sputter-Deposited Ni0.8Fe0.2 and Cu Films
Neerinck DG, Deveirman AE, Slangen MH, Rijks TG, Kools JC
Thin Solid Films, 280(1-2), 136, 1996 |
