화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 On the Spatial-Resolution of 2-Dimensional Doping Profiles as Measured Using Secondary-Ion Mass-Spectrometry Tomography
Liu X, Goodwinjohansson S, Jacobson JD, Ray MA, Mcguire GE
Journal of Vacuum Science & Technology B, 12(1), 116, 1994
2 2-Dimensional Doping Profiles from Experimentally Measured One-Dimensional Secondary-Ion Mass-Spectroscopy Data
Goodwinjohansson S, Liu XF, Ray M
Journal of Vacuum Science & Technology B, 12(1), 247, 1994