화학공학소재연구정보센터
검색결과 : 18건
No. Article
1 Analysis of resistive switching processes in TiN/Ti/HfO2/W devices to mimic electronic synapses in neuromorphic circuits
Gonzalez-Cordero G, Pedro M, Martin-Martinez J, Gonzalez MB, Jimenez-Molinos F, Campabadal F, Nafria N, Roldan JB
Solid-State Electronics, 157, 25, 2019
2 A flexible characterization methodology of RRAM: Application to the modeling of the conductivity changes as synaptic weight updates
Pedro M, Martin-Martinez J, Rodriguez R, Gonzalez MB, Campabadal F, Nafria M
Solid-State Electronics, 159, 57, 2019
3 Silver release from polypyrrole matrix in well water
Gonzalez MB, Flamini DO, Brugnoni LI, Pedersen PK, Saidman SB
Journal of Electroanalytical Chemistry, 765, 105, 2016
4 New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM
Maestro M, Diaz J, Crespo-Yepes A, Gonzalez MB, Martin-Martinez J, Rodriguez R, Nafria M, Campabadal F, Aymerich X
Solid-State Electronics, 115, 140, 2016
5 A new parameter to characterize the charge transport regime in Ni/HfO2/Si-n(+)-based RRAMs
Villena MA, Roldan JB, Gonzalez MB, Gonzalez-Rodelas P, Jimenez-Molinos F, Campabadal F, Barrera D
Solid-State Electronics, 118, 56, 2016
6 An in-depth study of thermal effects in reset transitions in HfO2 based RRAMs
Villena MA, Gonzalez MB, Roldan JB, Campabadal F, Jimenez-Molinos F, Gomez-Campos FM, Sune J
Solid-State Electronics, 111, 47, 2015
7 A petrological and organic geochemical study of Permian coal seams east of Maracaja, South Santa Catarina, Parana Basin, Brazil
da Costa JB, Lourenzi PD, Gonzalez MB, Peralba MDR, Kalkreuth W
International Journal of Coal Geology, 132, 51, 2014
8 Radiation tolerance of Si-1 (-) C-y(y) source/drain n-type metal oxide semiconductor field effect transistors with different carbon concentrations
Nakashima T, Asai Y, Hori M, Yoneoka M, Tsunoda I, Takakura K, Gonzalez MB, Simoen E, Claeys C, Yoshino K
Thin Solid Films, 557, 307, 2014
9 Silver deposition on polypyrrole films electrosynthesized in salicylate solutions
Gonzalez MB, Brugnoni LI, Vela ME, Saidman SB
Electrochimica Acta, 102, 66, 2013
10 2 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O3, HfO2 and nanolaminated dielectrics
Rafi JM, Campabadal F, Ohyama H, Takakura K, Tsunoda I, Zabala M, Beldarrain O, Gonzalez MB, Garcia H, Castan H, Gomez A, Duenas S
Solid-State Electronics, 79, 65, 2013