검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures Drozdov MN, Drozdov YN, Chkhalo NI, Polkovnikov VN, Yunin PA, Chirkin MV, Gololobov GP, Suvorov DV, Fu DJ, Pelenovich V, Tolstogouzov A Thin Solid Films, 661, 65, 2018 |
| 2 |
Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Drozdov MN, Drozdov YN, Csik A, Novikov AV, Vad K, Yunin PA, Yurasov DV, Belykh SF, Gololobov GP, Suvorov DV, Tolstogouzov A Thin Solid Films, 607, 25, 2016 |