검색결과 : 13건
No. | Article |
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1 |
Self-assembling of Zn porphyrins on a (110) face of rutile TiO2-The anchoring role of carboxyl groups Zajac L, Olszowski P, Godlewski S, Bodek L, Such B, Johr R, Pawlak R, Hinaut A, Glatzel T, Meyer E, Szymonski M Applied Surface Science, 379, 277, 2016 |
2 |
Biophotovoltaics: Natural pigments in dye-sensitized solar cells Hug H, Bader M, Mair P, Glatzel T Applied Energy, 115, 216, 2014 |
3 |
Development of scanning electrochemical microscopy (SECM) techniques for the optimization of dye sensitized solar cells Martin CJ, Bozic-Weber B, Constable EC, Glatzel T, Housecroft CE, Wright IA Electrochimica Acta, 119, 86, 2014 |
4 |
Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy Fleming Y, Wirtz T, Gysin U, Glatzel T, Wegmann U, Meyer E, Maier U, Rychen J Applied Surface Science, 258(4), 1322, 2011 |
5 |
Interface engineering in chalcopyrite thin film solar devices Fischer CH, Bar M, Glatzel T, Lauermann I, Lux-Steiner MC Solar Energy Materials and Solar Cells, 90(10), 1471, 2006 |
6 |
Efficiency limiting morphological factors of MDMO-PPV : PCBM plastic solar cells Hoppe H, Glatzel T, Niggemann M, Schwinger W, Schaeffler F, Hinsch A, Lux-Steiner MC, Sariciftci NS Thin Solid Films, 511, 587, 2006 |
7 |
Potential distribution of Cu(In,Ga)(S,Se)(2)-solar cell cross-sections measured by Kelvin probe force microscopy Glatzel T, Steigert H, Sadewasser S, Klenk R, Lux-Steiner MC Thin Solid Films, 480, 177, 2005 |
8 |
Assessing the performance of two-dimensional dopant profiling techniques Duhayon N, Eyber P, Fouchier M, Clarysee T, Vandervorst W, Alvarez D, Schoemann S, Ciappa M, Stangoni M, Fichtner W, Formanek P, Kittler M, Raineri V, Giannazzo F, Goghero D, Rosenwaks Y, Shikler R, Saraf S, Sadewasser S, Barreau N, Glatzel T, Verheijen M, Mentink SAM, von Sprekelsen M, Maltezopoulos T, Wiesendanger R, Hellemans L Journal of Vacuum Science & Technology B, 22(1), 385, 2004 |
9 |
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation Sadewasser S, Glatzel T, Shikler R, Rosenwaks Y, Lux-Steiner MC Applied Surface Science, 210(1-2), 32, 2003 |
10 |
Amplitude or frequency modulation-detection in Kelvin probe force microscopy Glatzel T, Sadewasser S, Lux-Steiner MC Applied Surface Science, 210(1-2), 84, 2003 |