화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Self-assembling of Zn porphyrins on a (110) face of rutile TiO2-The anchoring role of carboxyl groups
Zajac L, Olszowski P, Godlewski S, Bodek L, Such B, Johr R, Pawlak R, Hinaut A, Glatzel T, Meyer E, Szymonski M
Applied Surface Science, 379, 277, 2016
2 Biophotovoltaics: Natural pigments in dye-sensitized solar cells
Hug H, Bader M, Mair P, Glatzel T
Applied Energy, 115, 216, 2014
3 Development of scanning electrochemical microscopy (SECM) techniques for the optimization of dye sensitized solar cells
Martin CJ, Bozic-Weber B, Constable EC, Glatzel T, Housecroft CE, Wright IA
Electrochimica Acta, 119, 86, 2014
4 Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy
Fleming Y, Wirtz T, Gysin U, Glatzel T, Wegmann U, Meyer E, Maier U, Rychen J
Applied Surface Science, 258(4), 1322, 2011
5 Interface engineering in chalcopyrite thin film solar devices
Fischer CH, Bar M, Glatzel T, Lauermann I, Lux-Steiner MC
Solar Energy Materials and Solar Cells, 90(10), 1471, 2006
6 Efficiency limiting morphological factors of MDMO-PPV : PCBM plastic solar cells
Hoppe H, Glatzel T, Niggemann M, Schwinger W, Schaeffler F, Hinsch A, Lux-Steiner MC, Sariciftci NS
Thin Solid Films, 511, 587, 2006
7 Potential distribution of Cu(In,Ga)(S,Se)(2)-solar cell cross-sections measured by Kelvin probe force microscopy
Glatzel T, Steigert H, Sadewasser S, Klenk R, Lux-Steiner MC
Thin Solid Films, 480, 177, 2005
8 Assessing the performance of two-dimensional dopant profiling techniques
Duhayon N, Eyber P, Fouchier M, Clarysee T, Vandervorst W, Alvarez D, Schoemann S, Ciappa M, Stangoni M, Fichtner W, Formanek P, Kittler M, Raineri V, Giannazzo F, Goghero D, Rosenwaks Y, Shikler R, Saraf S, Sadewasser S, Barreau N, Glatzel T, Verheijen M, Mentink SAM, von Sprekelsen M, Maltezopoulos T, Wiesendanger R, Hellemans L
Journal of Vacuum Science & Technology B, 22(1), 385, 2004
9 Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Sadewasser S, Glatzel T, Shikler R, Rosenwaks Y, Lux-Steiner MC
Applied Surface Science, 210(1-2), 32, 2003
10 Amplitude or frequency modulation-detection in Kelvin probe force microscopy
Glatzel T, Sadewasser S, Lux-Steiner MC
Applied Surface Science, 210(1-2), 84, 2003