검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Sub-nanometer resolution XPS depth profiling: Sensing of atoms Szklarczyk M, Macak K, Roberts AJ, Takahashi K, Hutton S, Glaszczka R, Blomfield C Applied Surface Science, 411, 386, 2017 |
| No. | Article |
|---|---|
| 1 |
Sub-nanometer resolution XPS depth profiling: Sensing of atoms Szklarczyk M, Macak K, Roberts AJ, Takahashi K, Hutton S, Glaszczka R, Blomfield C Applied Surface Science, 411, 386, 2017 |