화학공학소재연구정보센터
검색결과 : 59건
No. Article
1 Band offsets in ITO/Ga2O3 heterostructures
Carey PH, Ren F, Hays DC, Gila BP, Pearton SJ, Jang S, Kuramata A
Applied Surface Science, 422, 179, 2017
2 Improvement of Off-State Stress Critical Voltage by Using Pt-Gated AlGaN/GaN High Electron Mobility Transistors
Lo CF, Liu L, Kang TS, Davies R, Gila BP, Pearton SJ, Kravchenko II, Laboutin O, Cao Y, Johnson WJ, Ren F
Electrochemical and Solid State Letters, 14(7), H264, 2011
3 Al2O3/InGaZnO4 Heterojunction Band Offsets by X-Ray Photoelectron Spectroscopy
Cho H, Douglas EA, Scheurmann A, Gila BP, Craciun V, Lambers ES, Pearton SJ, Ren F
Electrochemical and Solid State Letters, 14(11), H431, 2011
4 Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors
Chang CY, Anderson T, Hite J, Lu L, Lo CF, Chu BH, Cheney DJ, Douglas EA, Gila BP, Ren F, Via GD, Whiting P, Holzworth R, Jones KS, Jang S, Pearton SJ
Journal of Vacuum Science & Technology B, 28(5), 1044, 2010
5 Rectifying ZnO:Ag/ZnO:Ga Thin-Film Junctions
Lugo FJ, Kim HS, Pearton SJ, Abernathy CR, Gila BP, Norton DP, Wang YL, Ren F
Electrochemical and Solid State Letters, 12(5), H188, 2009
6 Pd-catalyzed hydrogen sensing with InN nanobelts
Wright JS, Lim W, Gila BP, Pearton SJ, Ren F, Lai WT, Chen LC, Hu MS, Chen KH
Journal of Vacuum Science & Technology B, 27(3), L8, 2009
7 Cu-plated through-wafer vias for AlGaN/GaN high electron mobility transistors on Si
Chen KH, Ren F, Pais A, Xie HK, Gila BP, Pearton SJ, Johnson JW, Rajagopal P, Roberts JC, Piner EL, Linthicum KJ
Journal of Vacuum Science & Technology B, 27(5), 2166, 2009
8 Surface and bulk thermal annealing effects on ZnO crystals
Lim W, Craciun V, Siebein K, Gila BP, Norton DP, Pearton SJ, Ren F
Applied Surface Science, 254(8), 2396, 2008
9 Ir-based diffusion barriers for Ohmic contacts to p-GaN
Voss LF, Stafford L, Gila BP, Pearton SJ, Ren F
Applied Surface Science, 254(13), 4134, 2008
10 RF-sputtered CrB2 diffusion barrier for Ni/Au Ohmic contacts on p-CuCrO2
Lim WT, Sadik PW, Norton DP, Gila BP, Pearton SJ, Kravchenko II, Ren F
Applied Surface Science, 254(16), 5211, 2008