검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings Adriaensen L, Vangaever F, Lenaerts J, Gijbels R Applied Surface Science, 252(19), 6628, 2006 |
| 2 |
Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) De Mondt R, Adriaensen L, Vangaever F, Lenaerts J, Van Vaeck L, Gijbels R Applied Surface Science, 252(19), 6652, 2006 |
| 3 |
Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition Adriaensen L, Vangaever F, Gijbels R Applied Surface Science, 231-2, 256, 2004 |
| 4 |
A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques Adriaensen L, Vangaever F, Gijbels R Applied Surface Science, 231-2, 348, 2004 |
| 5 |
Depth profiling of ZrO2/SiO2/Si stacks - a TOF-SIMS and computer simulation study Ignatova VA, Conard T, Moller W, Vandervorst W, Gijbels R Applied Surface Science, 231-2, 603, 2004 |
| 6 |
Modeling of the target surface modification by reactive ion implantation during magnetron sputtering Depla D, Chen ZY, Bogaerts A, Ignatova V, De Gryse R, Gijbels R Journal of Vacuum Science & Technology A, 22(4), 1524, 2004 |
| 7 |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks De Witte H, Conard T, Vandervorst W, Gijbels R Applied Surface Science, 203, 523, 2003 |
| 8 |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals Lenaerts J, Gijbels R, Van Vaeck L, Verlinden G, Geuens I Applied Surface Science, 203, 614, 2003 |
| 9 |
Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry Lenaerts J, Verlinden G, Van Vaeck L, Gijbels R, Geuens I, Callant P Langmuir, 17(23), 7332, 2001 |
| 10 |
Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on Si wafer surfaces De Witte H, De Gendt S, Douglas M, Conard T, Kenis K, Mertens PW, Vandervorst W, Gijbels R Journal of the Electrochemical Society, 147(5), 1915, 2000 |