검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
SiO2 interfacial layer as the origin of the breakdown of high-k dielectrics stacks Rafik M, Ribes G, Roy D, Ghibaudd G Journal of Vacuum Science & Technology B, 27(1), 472, 2009 |
| No. | Article |
|---|---|
| 1 |
SiO2 interfacial layer as the origin of the breakdown of high-k dielectrics stacks Rafik M, Ribes G, Roy D, Ghibaudd G Journal of Vacuum Science & Technology B, 27(1), 472, 2009 |