검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study Amoroso SM, Gerrer L, Markov S, Adamu-Lema F, Asenov A Solid-State Electronics, 84, 120, 2013 |
| 2 |
Impact of progressive oxide soft breakdown on metal oxide semiconductor parameters: Experiment and modeling Gerrer L, Ribes G, Ghibaudo G, Jomaah J Journal of Vacuum Science & Technology B, 27(1), 448, 2009 |