검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A method to analyze the impact of fast-recovering NBTI degradation on the stability of large-scale SRAM arrays Drapatz S, Hofmann K, Georgakos G, Schmitt-Landsiedel D Solid-State Electronics, 65-66, 191, 2011 |
| 2 |
Scaling properties of the tunneling field effect transistor (TFET): Device and circuit Nirschl T, Henzler S, Fischer J, Fulde M, Bargagli-Stoffi A, Sterkel M, Sedlmeir J, Weber C, Heinrich R, Schaper U, Einfeld J, Neubert R, Feldmann U, Stahrenberg K, Ruderer E, Georgakos G, Huber A, Kakoschke R, Hansch W, Schmitt-Landsiedel D Solid-State Electronics, 50(1), 44, 2006 |