화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Preferential {100} grain orientation in 10 micrometer-thick laser crystallized multicrystalline silicon on glass
Kuhnapfel S, Nickel NH, Gall S, Klaus M, Genzel C, Rech B, Amkreutz D
Thin Solid Films, 576, 68, 2015
2 Determination of composition, residual stress and stacking fault depth profiles in expanded austenite with energy-dispersive diffraction
Jegou S, Christiansen TL, Klaus M, Genzel C, Somers MAJ
Thin Solid Films, 530, 71, 2013
3 In-situ studies of the recrystallization process of CuInS2 thin films by energy dispersive X-ray diffraction
Thomas D, Mainz R, Rodriguez-Alvarez H, Marsen B, Abou-Ras D, Klaus M, Genzel C, Schock HW
Thin Solid Films, 519(21), 7193, 2011
4 Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction
Kirchlechner C, Martinschitz KJ, Daniel R, Klaus M, Genzel C, Mitterer C, Keckes J
Thin Solid Films, 518(8), 2090, 2010
5 Growth paths for the sulfurization of Cu-rich Cu/In thin films
Rodriguez-Alvarez H, Koetschau IM, Genzel C, Schock HW
Thin Solid Films, 517(7), 2140, 2009
6 Residual stress depth profiling in complex hard coating systems by X-ray diffraction
Klaus M, Genzel C, Holzschuh H
Thin Solid Films, 517(3), 1172, 2008
7 Determination of real space residual stress distributions sigma(ij) (z) of surface treated materials with diffraction methods Part II: Energy dispersive approach
Denks IA, Klaus M, Genzel C
Materials Science Forum, 524-525, 37, 2006
8 The materials science beamline EDDI for energy-dispersive analysis of subsurface residual stress gradients
Genzel C, Denks IA, Klaus M
Materials Science Forum, 524-525, 193, 2006
9 X-ray diffraction analysis of nonuniform residual stress fields sigma(ii)(tau) under difficult conditions
Klaus M, Denks IA, Genzel C
Materials Science Forum, 524-525, 601, 2006
10 Problems related to energy-dispersive X-ray stress analysis performed in reflection geometry
Stock C, Genzel C, Reimers W
Materials Science Forum, 404-7, 13, 2002