1 |
Preferential {100} grain orientation in 10 micrometer-thick laser crystallized multicrystalline silicon on glass Kuhnapfel S, Nickel NH, Gall S, Klaus M, Genzel C, Rech B, Amkreutz D Thin Solid Films, 576, 68, 2015 |
2 |
Determination of composition, residual stress and stacking fault depth profiles in expanded austenite with energy-dispersive diffraction Jegou S, Christiansen TL, Klaus M, Genzel C, Somers MAJ Thin Solid Films, 530, 71, 2013 |
3 |
In-situ studies of the recrystallization process of CuInS2 thin films by energy dispersive X-ray diffraction Thomas D, Mainz R, Rodriguez-Alvarez H, Marsen B, Abou-Ras D, Klaus M, Genzel C, Schock HW Thin Solid Films, 519(21), 7193, 2011 |
4 |
Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction Kirchlechner C, Martinschitz KJ, Daniel R, Klaus M, Genzel C, Mitterer C, Keckes J Thin Solid Films, 518(8), 2090, 2010 |
5 |
Growth paths for the sulfurization of Cu-rich Cu/In thin films Rodriguez-Alvarez H, Koetschau IM, Genzel C, Schock HW Thin Solid Films, 517(7), 2140, 2009 |
6 |
Residual stress depth profiling in complex hard coating systems by X-ray diffraction Klaus M, Genzel C, Holzschuh H Thin Solid Films, 517(3), 1172, 2008 |
7 |
Determination of real space residual stress distributions sigma(ij) (z) of surface treated materials with diffraction methods Part II: Energy dispersive approach Denks IA, Klaus M, Genzel C Materials Science Forum, 524-525, 37, 2006 |
8 |
The materials science beamline EDDI for energy-dispersive analysis of subsurface residual stress gradients Genzel C, Denks IA, Klaus M Materials Science Forum, 524-525, 193, 2006 |
9 |
X-ray diffraction analysis of nonuniform residual stress fields sigma(ii)(tau) under difficult conditions Klaus M, Denks IA, Genzel C Materials Science Forum, 524-525, 601, 2006 |
10 |
Problems related to energy-dispersive X-ray stress analysis performed in reflection geometry Stock C, Genzel C, Reimers W Materials Science Forum, 404-7, 13, 2002 |