| 1 |
Effects of annealing and conformal alumina passivation on anisotropy and hysteresis of magneto-optical properties of cobalt slanted columnar thin films
Briley C, Mock A, Korlacki R, Hofmann T, Schubert E, Schubert M
Applied Surface Science, 421, 320, 2017 |
| 2 |
Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry
Hofmann T, Knight S, Sekora D, Schmidt D, Herzinger CM, Woollam JA, Schubert E, Schubert M
Applied Surface Science, 421, 513, 2017 |
| 3 |
Combined quartz crystal microbalance with dissipation (QCM-D) and generalized ellipsometry (GE) to characterize the deposition of titanium dioxide nanoparticles on model rough surfaces
Kananizadeh N, Rice C, Lee J, Rodenhausen KB, Sekora D, Schubert M, Schubert E, Bartelt-Hunt S, Li YS
Journal of Hazardous Materials, 322, 118, 2017 |
| 4 |
The retention of liquid by columnar nanostructured surfaces during quartz crystal microbalance measurements and the effects of adsorption thereon
Rodenhausen KB, Davis RS, Sekora D, Liang D, Mock A, Neupane R, Schmidt D, Hofmann T, Schubert E, Schubert M
Journal of Colloid and Interface Science, 455, 226, 2015 |
| 5 |
Characterization of highly anisotropic three-dimensionally nanostructured surfaces
Schmidt D
Thin Solid Films, 571, 364, 2014 |
| 6 |
The dielectric tensor of monoclinic alpha-3,4,9,10-perylene tetracarboxylic dianhydride in the visible spectral range
Alonso MI, Garriga M, Osso JO, Schreiber F, Scholz R
Thin Solid Films, 571, 420, 2014 |
| 7 |
Theory of dual-rotating polarizer and analyzer ellipsometer
Gilliot M, Naciri AE
Thin Solid Films, 540, 46, 2013 |
| 8 |
Selective sensitivity of ellipsometry to magnetic nanostructures
Postava K, Hrabovsky D, Hamrlova J, Pistora J, Wawro A, Baczewski LT, Sveklo I, Maziewski A
Thin Solid Films, 519(9), 2627, 2011 |
| 9 |
Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer
Schmidt D, Muller C, Hofmann T, Inganas O, Arwin H, Schubert E, Schubert M
Thin Solid Films, 519(9), 2645, 2011 |
| 10 |
Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures
Schubert M, Hofmann T, Herzinger CM
Thin Solid Films, 455-56, 563, 2004 |
