검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
A critical comparison between XRD and FIB residual stressmeasurement techniques in thin films Bemporad E, Brisotto M, Depero LE, Gelfi M, Korsunsky AM, Lunt AJG, Sebastiani M Thin Solid Films, 572, 224, 2014 |
| 2 |
Bidimensional X-ray diffraction analysis for structural and microstructural characterization of lanthanum manganite thin films Alessandri I, Gelfi M, Bontempi E, Roberti R, Depero LE Journal of Physical Chemistry B, 108(17), 5189, 2004 |
| 3 |
Residual stress analysis of thin films and coatings through XRD2 experiments Gelfi M, Bontempi E, Roberti R, Armelao L, Depero LE Thin Solid Films, 450(1), 143, 2004 |