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| No. | Article |
|---|---|
| 1 |
Low-temperature fabrication of Y2O3/Ge gate stacks with ultrathin GeOx interlayer and low interface states density characterized by a reliable deep-level transient spectroscopy method Wang D, Nagatomi Y, Kojima S, Yamamoto K, Nakashima H Thin Solid Films, 557, 288, 2014 |