검색결과 : 1건
No. | Article |
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1 |
Scanning capacitance microscopy imaging of silicon metal-oxide-semiconductor field effect transistors Kleiman RN, O'Malley ML, Baumann FH, Garno JP, Timp GL Journal of Vacuum Science & Technology B, 18(4), 2034, 2000 |
No. | Article |
---|---|
1 |
Scanning capacitance microscopy imaging of silicon metal-oxide-semiconductor field effect transistors Kleiman RN, O'Malley ML, Baumann FH, Garno JP, Timp GL Journal of Vacuum Science & Technology B, 18(4), 2034, 2000 |