검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Effect of angle deposition gamma on the structural, optical and electrical properties of copper oxide zigzag ( plus gamma, -gamma) nanostructures elaborated by glancing angle deposition Akkari FC, Ben Jbara H, Abdelkader D, Gallas B, Kanzari M Thin Solid Films, 657, 61, 2018 |
| 2 |
Investigation of growth and characterization of nanostructured CuIn5S8 thin films produced by glancing angle deposition Sinaoui A, Chaffar-Akkari F, Gallas B, Demaille D, Kanzari M Thin Solid Films, 590, 111, 2015 |
| 3 |
Importance of Mueller matrix characterization of bianisotropic metamaterials Guth N, Varault S, Grand J, Guida G, Bonod N, Gallas B, Rivory J Thin Solid Films, 571, 405, 2014 |
| 4 |
Nanostructured chiral silver thin films: A route to metamaterials at optical frequencies Gallas B, Guth N, Rivory J, Arwin H, Magnusson R, Guida G, Yang J, Robbie K Thin Solid Films, 519(9), 2650, 2011 |
| 5 |
Dielectric function of Si nanocrystals embedded in SiO2 Gallas B, Kao CC, Defranoux C, Fisson S, Vuye G, Rivory J Thin Solid Films, 455-56, 335, 2004 |
| 6 |
Laser annealing of SiOx thin films Gallas B, Kao CC, Fisson S, Vuye G, Rivory J, Bernard Y, Belouet C Applied Surface Science, 185(3-4), 317, 2002 |
| 7 |
Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity Brunet-Bruneau A, Fisson S, Gallas B, Vuye G, Rivory J Thin Solid Films, 377-378, 57, 2000 |
| 8 |
Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors Gallas B, Fisson S, Brunet-Bruneau A, Vuye G, Rivory J Thin Solid Films, 377-378, 62, 2000 |
| 9 |
Kinetic roughening of Si surfaces and surfactant effect in low temperature molecular beam epitaxy growth Gallas B, Berbezier I, Derrien J, Gandolfo D, Ruiz J, Zagrebnov VA Journal of Vacuum Science & Technology B, 16(3), 1564, 1998 |
| 10 |
New insights on SiGe growth instabilities Berbezier I, Gallas B, Lapena L, Fernandez J, Derrien J, Joyce B Journal of Vacuum Science & Technology B, 16(3), 1582, 1998 |