화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 High accuracy thermal resistance measurement in GaN/InGaN laser diodes
Wen PY, Li DY, Zhang SM, Liu JP, Zhang LQ, Zhou K, Feng MX, Li ZC, Tian AQ, Yang H
Solid-State Electronics, 106, 50, 2015
2 The effect of dislocations on the efficiency of InGaN/GaN solar cells
Zhang Y, Kappers MJ, Zhu D, Oehler F, Gao F, Humphreys CJ
Solar Energy Materials and Solar Cells, 117, 279, 2013
3 Iridium-based semi-transparent current spreading layer on short-period-superlattice (SPS) tunneling contact of InGaN/GaN LEDs
Chuang RW, Chiu YJ, Yu CL
Solid-State Electronics, 50(7-8), 1212, 2006
4 Photoluminescence characteristics of low indium composition InGaN thin films grown on sapphire by metalorganic chemical vapor deposition
Feng ZC, Liu W, Chua SJ, Yu JW, Yang CC, Yang TR, Zhao J
Thin Solid Films, 498(1-2), 118, 2006
5 Indium concentration influence on PL spatial inhomogeneity in InGaN single quantum well structures detected by original low-cost near-field probes
Micheletto R, Yoshimatsu N, Kaneta A, Kawakami Y, Fujita S
Applied Surface Science, 229(1-4), 338, 2004
6 Characteristics of stable emission GaN-based resonant-cavity light-emitting diodes
Lin CF, Yao HH, Lu JW, Hsieh YL, Kuo HC, Wang SC
Journal of Crystal Growth, 261(2-3), 359, 2004
7 Homoepitaxially grown GaN-based light-emitting diodes with peak emission at 405 nm
Cao XA, Yan CH, D'Evelyn MP, LeBoeuf SF, Kretchmer JW, Klinger R, Arthur SD, Merfeld DW
Journal of Crystal Growth, 269(2-4), 242, 2004
8 High-performance GaN/InGaN heterostructure FETs on Mg-doped GaN current blocking layers
Kuan TM, Chang SJ, Su YK, Lin JC, Wei SC, Wang CK, Huang CI, Lan WH, Bardwell JA, Tang H, Lin WJ, Cherng YT
Journal of Crystal Growth, 272(1-4), 300, 2004
9 Reactive ion etching of GaN/InGaN using BCl3 plasma
Hong HF, Chao CK, Chyi JI, Tzeng YC
Materials Chemistry and Physics, 77(2), 411, 2003
10 Thermal annealing effects on the optical gain of InGaN/GaN quantum well structures
Chen CC, Hsueh TH, Ting YS, Chi GC, Chang CA, Wang SC
Solid-State Electronics, 47(3), 575, 2003