검색결과 : 15건
| No. | Article |
|---|---|
| 1 |
In-situ characterization of electron-assisted regeneration of Cz-Si solar cells Helmich L, Walter DC, Bredemeier D, Falster R, Voronkov VV, Schmidt J Solar Energy Materials and Solar Cells, 185, 283, 2018 |
| 2 |
Correlation of the LeTID amplitude to the Aluminium bulk concentration and Oxygen precipitation in PERC solar cells Wagner M, Wolny F, Hentsche M, Krause A, Sylla L, Kropfgans F, Ernst M, Zierer R, Bonisch P, Muller P, Schmidt N, Osinniy V, Hartmann HP, Mehnert R, Neuhaus H Solar Energy Materials and Solar Cells, 187, 176, 2018 |
| 3 |
Impact of hydrogen on the permanent deactivation of the boron-oxygen-related recombination center in crystalline silicon Walter DC, Schmidt J Solar Energy Materials and Solar Cells, 158, 91, 2016 |
| 4 |
Selectively grown vertical silicon nanowire p-n(+) photodiodes via aqueous electroless etching Lee H, Hong J, Lee S, Kim SD, Kim YW, Lee T Applied Surface Science, 274, 79, 2013 |
| 5 |
Repair of thin thermally grown silicon dioxide by anodic oxidation Chen L, Zhou YL, Krause S, Munoz AG, Kunze J, Schmuki P Electrochimica Acta, 53(8), 3395, 2008 |
| 6 |
Electrical properties of MOS structures on nitrogen-doped Czochralski-grown silicon: A positron annihilation study Slugen V, Harmatha L, Tapaina M, Ballo P, Pisecny P, Sik J, Kogel G, Krsjak V Applied Surface Science, 252(9), 3201, 2006 |
| 7 |
Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress Reif J, Schmid R, Schneider T, Wolfframm D Solid-State Electronics, 44(5), 809, 2000 |
| 8 |
Analysis of iron precipitation in silicon as a basis for gettering simulations Hieslmair H, Istratov AA, McHugo SA, Flink C, Weber ER Journal of the Electrochemical Society, 145(12), 4259, 1998 |
| 9 |
Influence of Nitrogen or Argon Anneals on the Properties of Wafers and Devices Separated by Implantation of Oxygen Cristoloveanu S, Ionescu A, Wetteroth T, Shin H, Munteanu D, Gentil P, Hong S, Wilson SR Journal of the Electrochemical Society, 144(4), 1468, 1997 |
| 10 |
Metallic Impurity Gettering and Secondary Defect Formation in Megaelectron Volt Self-Implanted Czochralski and Float-Zone Silicon Brown RA, Kononchuk O, Bondarenko I, Romanowski A, Radzimski Z, Rozgonyi GA, Gonzalez F Journal of the Electrochemical Society, 144(8), 2872, 1997 |