검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
X-ray CTR scattering measurement of InP/InGaAs/InP interface structures fabricated by different growth processes Tabuchi M, Takahashi R, Araki M, Hirayama K, Futakuchi N, Shimogaki Y, Nakano Y, Takeda Y Applied Surface Science, 159, 250, 2000 |
| 2 |
MOCVD of InGaAsP, InGaAs and InGaP over InP and GaAs substrates: distribution of composition and growth rate in a horizontal reactor Feron O, Sugiyama M, Asawamethapant W, Futakuchi N, Feurprier Y, Nakano Y, Shimogaki Y Applied Surface Science, 159, 318, 2000 |