| 1 |
Material parameters from frequency dispersion simulation of floating gate memory with Ge nanocrystals in HfO2
Palade C, Lepadatu AM, Slav A, Lazanu S, Teodorescu VS, Stoica T, Ciurea ML
Applied Surface Science, 428, 698, 2018 |
| 2 |
Influence of geometry-induced frequency dispersion on the impedance of rectangular electrodes
Davis K, Dizon A, Alexander CL, Orazem ME
Electrochimica Acta, 283, 1820, 2018 |
| 3 |
Shear horizontal wave dispersion in nanolayers with surface effects and determination of surface elastic constants
Jia F, Zhang ZC, Zhang HB, Feng XQ, Gu B
Thin Solid Films, 645, 134, 2018 |
| 4 |
Assessing the photoelectrochemical properties of C, N, F codoped TiO2 nanotubes of different lengths
Chatzitakis A, Grandcolas M, Xu KQ, Mei S, Yang J, Jensen IJT, Simon C, Norby T
Catalysis Today, 287, 161, 2017 |
| 5 |
Influence of Geometry-Induced Frequency Dispersion on the Impedance of Ring Electrodes
Chen YM, Alexander CL, Cleveland C, Orazem ME
Electrochimica Acta, 235, 437, 2017 |
| 6 |
On the theory of the generalized Gerischer impedance for an electrode with modeling roughness
Pototskaya VV, Gichan OI
Electrochimica Acta, 235, 583, 2017 |
| 7 |
Contribution of Surface Distributions to Constant-Phase-Element (CPE) Behavior: 3. Adsorbed Intermediates
Alexander CL, Tribollet B, Vivier V, Orazem ME
Electrochimica Acta, 251, 99, 2017 |
| 8 |
Single frequency correction based on three-element model for thin dielectric MOS capacitor
Zhang XZ, Zhu HC, Cheng CH, Yu T, Zhang DM, Zhang H, Li XP, Cheng Y, Xu XS, Cheng LH, Sun JS, Chen BJ
Solid-State Electronics, 129, 97, 2017 |
| 9 |
Contribution of Surface Distributions to Constant-Phase-Element (CPE) Behavior: 2. Capacitance
Alexander CL, Tribollet B, Orazem ME
Electrochimica Acta, 188, 566, 2016 |
| 10 |
Influence of Micrometric-Scale Electrode Heterogeneity on Electrochemical Impedance Spectroscopy
Alexander CL, Tribollet B, Orazema ME
Electrochimica Acta, 201, 374, 2016 |
