검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Extension of Far UV spectroscopic ellipsometry studies of High-kappa dielectric films to 130 nm Kamineni VK, Hilfiker JN, Freeouf JL, Consiglio S, Clark R, Leusink GJ, Diebold AC Thin Solid Films, 519(9), 2894, 2011 |
| 2 |
Optical properties of La-based high-K dielectric films Cicerrella E, Freeouf JL, Edge LF, Schlom DG, Heeg T, Schubert J, Chambers SA Journal of Vacuum Science & Technology A, 23(6), 1676, 2005 |
| 3 |
Reflection Anisotropy Spectroscopy, Surface Photovoltage Spectroscopy, and Contactless Electroreflectance Investigation of the InP/In0.53Ga0.47As(001)Heterojunction System Leibovitch M, Ram P, Malikova L, Pollak FH, Freeouf JL, Kronik L, Mishori B, Shapira Y, Clawson AR, Hanson CM Journal of Vacuum Science & Technology B, 14(4), 3089, 1996 |