| 1 |
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory
Ohlidal I, Vohanka J, Cermak M, Franta D
Applied Surface Science, 419, 942, 2017 |
| 2 |
Temperature-dependent dispersion model of float zone crystalline silicon
Franta D, Dubroka A, Wang CN, Giglia A, Vohanka J, Franta P, Ohlidal I
Applied Surface Science, 421, 405, 2017 |
| 3 |
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry
Franta D, Kotilainen M, Krumpolec R, Ohlidal I
Applied Surface Science, 421, 420, 2017 |
| 4 |
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride
Franta D, Necas D, Giglia A, Franta P, Ohlidal I
Applied Surface Science, 421, 424, 2017 |
| 5 |
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
Ohlidal I, Franta D, Necas D
Applied Surface Science, 421, 687, 2017 |
| 6 |
Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers
Kotilainen M, Krumpolec R, Franta D, Soucek P, Homola T, Cameron DC, Vuoristo P
Solar Energy Materials and Solar Cells, 166, 140, 2017 |
| 7 |
Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model
Franta D, Cermak M, Vohanka J, Ohlidal I
Thin Solid Films, 631, 12, 2017 |
| 8 |
Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen
Franta D, Necas D, Zajickova L, Ohlidal I
Thin Solid Films, 571, 490, 2014 |
| 9 |
Broadening of dielectric response and sum rule conservation
Franta D, Necas D, Zajickova L, Ohlidal I
Thin Solid Films, 571, 496, 2014 |
| 10 |
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
Necas D, Ohlidal I, Franta D, Cudek V, Ohlidal M, Vodak J, Sladkova L, Zajickova L, Elias M, Vizd'a F
Thin Solid Films, 571, 573, 2014 |
