1 |
Characterization of ZnO thin films grown on different p-Si substrate elaborated by solgel spin-coating method Chebil W, Fouzri A, Fargi A, Azeza B, Zaaboub Z, Sallet V Materials Research Bulletin, 70, 719, 2015 |
2 |
Structural, morphological and optical properties of Cd doped ZnO film grown on a- and r-plane sapphire substrate by MOCVD Fouzri A, Boukadhaba MA, Toure A, Sakly N, Bchetnia A, Sallet V Applied Surface Science, 311, 648, 2014 |
3 |
Characterizations of ZnO and Zn(1-x)CdxO thin films grown on Zn- and O-face ZnO substrates by metal organic chemical vapor deposition Boukadhaba MA, Fouzri A, Saidi C, Sakly N, Souissi A, Bchetnia A, Sartel C, Sallet V, Oumezzine M Journal of Crystal Growth, 395, 14, 2014 |
4 |
Structural properties and morphology of Zn(1-x)CdxO solid solution grown on ZnO and C-plane sapphire substrate Fouzri A, Boukadhaba MA, Oumezzine M, Sallet V Thin Solid Films, 520(7), 2582, 2012 |
5 |
Growth of n-GaAs layer on a rough surface of p-Si substrate by molecular beam epitaxy (MBE) for photovoltaic applications Azeza B, Sfaxi L, M'ghaieth R, Fouzri A, Maaref H Journal of Crystal Growth, 317(1), 104, 2011 |
6 |
A comparative structure and morphology study of Zn(1-x)CdxO solid solution grown on ZnO and different sapphire orientations Fouzri A, Sallet V, Oumezzine M Journal of Crystal Growth, 331(1), 18, 2011 |
7 |
High resolution X-ray diffraction of GaN grown on Si (111) by MOVPE Chaaben N, Boufaden T, Fouzri A, Bergaoui MS, El Jani B Applied Surface Science, 253(1), 241, 2006 |
8 |
Laser reflectometry in situ monitoring of InGaAs grown by atmospheric pressure metalorganic vapour phase epitaxy Habchi MM, Rebey A, Fouzri A, El Jani B Applied Surface Science, 253(1), 275, 2006 |
9 |
AP-MOVPE of thin GaAs1-xBix alloys Fitouri H, Moussa I, Rebey A, Fouzri A, El Jani B Journal of Crystal Growth, 295(2), 114, 2006 |
10 |
Water confined in silica gel and in vycor glass at low and room temperature, x-ray diffraction study Fouzri A, Dorbez-Sridi R, Oumezzine M Journal of Chemical Physics, 116(2), 791, 2002 |