검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Gate oxide reliability in an integrated metal-oxide-semiconductor field-effect transistor-microelectromechanical system technology Fleming RM, Draper BL Journal of Vacuum Science & Technology B, 24(1), 91, 2006 |
| 2 |
CVD of Zr-Sn-Ti-O thin films by direct injection of solventless liquid precursor mixtures Senzaki Y, Alers GB, Hochberg AK, Roberts DA, Norman JAT, Fleming RM, Krautter H Electrochemical and Solid State Letters, 3(9), 435, 2000 |
| 3 |
Discovery of a useful thin-film dielectric using a composition-spread approach van Dover RB, Schneemeyer LD, Fleming RM Nature, 392(6672), 162, 1998 |
| 4 |
Charge-Transfer Salts of Benzene-Bridged 1,2,3,5-Dithiadiazolyl Diradicals - Preparation, Structures, and Transport-Properties of 1,3-((S2N2C)C6H4(Cn2S2))(X) and 1,4-((S2N2C)C6H4(Cn2S2))(X) (X=i,Br) Bryan CD, Cordes AW, Fleming RM, George NA, Glarum SH, Haddon RC, Mackinnon CD, Oakley RT, Palstra TT, Perel AS Journal of the American Chemical Society, 117(26), 6880, 1995 |
| 5 |
C-60 Films on Surface-Treated Silicon - Recipes for Amorphous and Crystalline Growth Hebard AF, Zhou O, Zhong Q, Fleming RM, Haddon RC Thin Solid Films, 257(2), 147, 1995 |
| 6 |
Defects in Carbon Nanostructures Zhou O, Fleming RM, Murphy DW, Chen CH, Haddon RC, Ramirez AP, Glarum SH Science, 263(5154), 1744, 1994 |
| 7 |
New Phases of C-60 Synthesized at High-Pressure Iwasa Y, Arima T, Fleming RM, Siegrist T, Zhou O, Haddon RC, Rothberg LJ, Lyons KB, Carter HL, Hebard AF, Tycko R, Dabbagh G, Krajewski JJ, Thomas GA, Yagi T Science, 264(5165), 1570, 1994 |
| 8 |
Magnetic-Susceptibility of Molecular Carbon - Nanotubes and Fullerite Ramirez AP, Haddon RC, Zhou O, Fleming RM, Zhang J, Mcclure SM, Smalley RE Science, 265(5168), 84, 1994 |