| 1 |
Controlled kinetic Monte Carlo simulation of laser improved nano particle deposition process
Song JH, Choi KH, Dai RN, Choi JO, Ahn SH, Wang Y
Powder Technology, 325, 651, 2018 |
| 2 |
Characterization of thin SiGe layers on Si (001) by spectroscopic ellipsometry for Ge fractions from 0 to 100%
Schmidt J, Eilert M, Peters S, Wietler TF
Applied Surface Science, 421, 772, 2017 |
| 3 |
Optical properties of Ba0.6K0.4Fe2As2 thin film prepared by pulsed laser deposition and subsequent post-annealing process
Lee S, Seo YS, Roh S, Lee NH, Kang WN, Hwang J
Current Applied Physics, 17(7), 976, 2017 |
| 4 |
Laser fluence and spot size effect on compositional and structural properties of BiFeO3 thin films grown by Pulsed Laser Deposition
Jaber N, Wolfman J, Daumont C, Negulescu B, Ruyter A, Sauvage T, Courtois B, Bouyanfif H, Longuet JL, Autret-Lambert C, Gervais F
Thin Solid Films, 634, 107, 2017 |
| 5 |
Glow discharge optical emission spectroscopy for accurate and well resolved analysis of coatings and thin films
Wilke M, Teichert G, Gemma R, Pundt A, Kirchheim R, Romanus H, Schaaf P
Thin Solid Films, 520(5), 1660, 2011 |
| 6 |
Development and application of glancing incident X-ray fluorescence spectrometry using parallel polycapillary X-ray lens
Yang J, Zhao DD, Xu Q, Ding XL
Applied Surface Science, 255(13-14), 6439, 2009 |
| 7 |
A micro X-ray fluorescence analysis method using polycapillary X-ray optics and grazing exit geometry
Yang J, Tsuji K, Lin XY, Han DY, Ding XL
Thin Solid Films, 517(11), 3357, 2009 |
| 8 |
Optical analysis of coatings by variable angle spectrophotometry
Van Nijnatten PA
Thin Solid Films, 516(14), 4553, 2008 |
| 9 |
Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness
Barna A, Menyhard A, Zalar A, Panjan P
Applied Surface Science, 242(3-4), 375, 2005 |
| 10 |
Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections
Scheithauer U
Applied Surface Science, 179(1-4), 20, 2001 |
