| 1 |
Growth mechanism investigation of SnO2 thin films deposited by aerosol pyrolysis for biosensor applications: Importance of the thickness
Stambouli V, Manesse M, Ferrieu F, Rapenne L, Roussel H, Chaudouet P, Szunerits S
Thin Solid Films, 520(11), 3878, 2012 |
| 2 |
Analysis of textured films and periodic grating structures with Mueller matrices: A new challenge in instrumentation with the generation of angle-resolved SE polarimeters
Ferrieu F, Novikova T, Fallet C, Ben Hatit S, Vannuffel C, De Martino A
Thin Solid Films, 519(9), 2608, 2011 |
| 3 |
Spectroscopic ellipsometry of SixGe1-x/Si: a tool for composition and profile analysis in strained heterostructures used in the microelectronics industry
Ferrieu F, Ribot P, Regolini JL
Thin Solid Films, 373(1-2), 211, 2000 |
| 4 |
Optical characterization by spectroscopic ellipsometry of polycrystalline Si1-xGex of variable Ge composition up to 100% Ge
Ferrieu F, Morin C, Regolini JL
Thin Solid Films, 315(1-2), 316, 1998 |
| 5 |
Real-Time Ultraviolet Ellipsometry Monitoring of Gate Patterning in a High-Density Plasma
Vallon S, Joubert O, Vallier L, Ferrieu F, Drevillon B, Blayo N
Journal of Vacuum Science & Technology A, 15(3), 865, 1997 |
| 6 |
Strain Compensated Heterostructures in the Si1-X-Ygexcy Ternary-System
Regolini JL, Bodnar S, Oberlin JC, Ferrieu F, Gauneau M, Lambert B, Boucaud P
Journal of Vacuum Science & Technology A, 12(4), 1015, 1994 |
| 7 |
In-Situ Ellipsometric Control of Si1-xGex/Si Heterostructures Grown by Chemical Beam Epitaxy
Boucaud P, Glowacki F, Ferrieu F, Larre A, Perio A, Bensahel D
Thin Solid Films, 248(1), 1, 1994 |
