검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework Suthar K, Shah D, Wang J, He QP Computers & Chemical Engineering, 127, 140, 2019 |
| 2 |
Feature space monitoring for smart manufacturing via statistics pattern analysis He QP, Wang J, Shah D Computers & Chemical Engineering, 126, 321, 2019 |
| 3 |
DISCRIMINANT DIFFUSION MAPS BASED K-NEAREST-NEIGHBOUR FOR BATCH PROCESS FAULT DETECTION Li Y, Liu YD, Zhang C Canadian Journal of Chemical Engineering, 96(2), 484, 2018 |
| 4 |
Detecting clipping in photovoltaic solar plants using fuzzy systems on the feature space Fernandez FS, Munoz-Garcia MA, Saminger-Platz S Solar Energy, 132, 345, 2016 |
| 5 |
Quality relevant nonlinear batch process performance monitoring using a kernel based multiway non-Gaussian latent subspace projection approach Mori J, Yu J Journal of Process Control, 24(1), 57, 2014 |