검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Fabrication and Transport Measurements of Atomic-Force Microscope Modified Silicon Metal-Oxide-Semiconductor Field-Effect Transistors Fayfield T, Higman TK Journal of Vacuum Science & Technology B, 13(3), 1285, 1995 |
| 2 |
Quantitative Study of Metal-Oxide-Semiconductor Field-Effect Transistor Damage-Induced by Scanning Tunneling Microscope Lithography Fayfield T, Higman TK Journal of Vacuum Science & Technology B, 12(6), 3731, 1994 |