검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Depth profiling using C60+SIMS - Deposition and topography development during bombardment of silicon Gillen G, Batteas J, Michaels CA, Chi P, Small J, Windsor E, Fahey A, Verkouteren J, Kim KJ Applied Surface Science, 252(19), 6521, 2006 |
| 2 |
3D molecular imaging SIMS Gillen G, Fahey A, Wagner M, Mahoney C Applied Surface Science, 252(19), 6537, 2006 |
| 3 |
SIMS depth profiling of polymer blends with protein based drugs Mahoney CM, Yu JX, Fahey A, Gardella JA Applied Surface Science, 252(19), 6609, 2006 |
| 4 |
Secondary ion mass spectrometry using cluster primary ion beams Gillen G, Fahey A Applied Surface Science, 203, 209, 2003 |
| 5 |
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces Roberson S, Sehgal A, Fahey A, Karim A Applied Surface Science, 203, 855, 2003 |