검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
High resolution depth profiling of thin STO in high-k oxide material Ehrke U, Sears A, Alff L, Reisinger D Applied Surface Science, 231-2, 598, 2004 |
| 2 |
Use of SIMS in SiGe process control Maul JL, Chou PF, Lu YH Applied Surface Science, 231-2, 713, 2004 |