검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics Boher R, Evrard R, Condat O, Dos Reis C, Defranoux C, Bellandi E Thin Solid Films, 450(1), 114, 2004 |
| 2 |
Electronic properties of poly(3-methylthiophene) Tagmouti S, Outzourhit A, Oueriagli A, Khaidar M, Elyacoubi M, Evrard R, Ameziane EL Solar Energy Materials and Solar Cells, 71(1), 9, 2002 |
| 3 |
Experimental and theoretical investigations of the electrical properties of undoped and magnesium-doped GaN layers Nguyen ND, Germain M, Schmeits M, Evrard R, Schineller B, Heuken M Journal of Crystal Growth, 230(3-4), 596, 2001 |
| 4 |
Electrical characteristics of W/P3MT/Pt diodes Tagmouti S, Outzourhit A, Oueriagli A, Khaidar M, Elyacoubi M, Evrard R, Ameziane EL Thin Solid Films, 379(1-2), 272, 2000 |