검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Surface and interface characterization of GaN/AlGaN high electron mobility transistor structures by x-ray and atomic force microscopy Torabi A, Ericson P, Yarranton EJ, Hoke WE Journal of Vacuum Science & Technology B, 20(3), 1234, 2002 |