검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Investigation of gate length and fringing field effects for program and erase efficiency in gate-all-around SONOS memory cells Kim MS, Choi SJ, Moon DI, Duarte JP, Kim S, Choi YK Solid-State Electronics, 79, 7, 2013 |
| No. | Article |
|---|---|
| 1 |
Investigation of gate length and fringing field effects for program and erase efficiency in gate-all-around SONOS memory cells Kim MS, Choi SJ, Moon DI, Duarte JP, Kim S, Choi YK Solid-State Electronics, 79, 7, 2013 |