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| No. | Article |
|---|---|
| 1 |
Ellipsometry investigation of the effects of annealing temperature on the optical properties of indium tin oxide thin films studied by Drude-Lorentz model D'Elia S, Scaramuzza N, Ciuchi F, Versace C, Strangi G, Bartolino R Applied Surface Science, 255(16), 7203, 2009 |